The unified Temperature Sensor Emulator (TSE) with Fault Insertion Unit (FIU) allows you to test your battery management system (BMS) under varying thermal conditions for typical and fault scenarios. This enables you to emulate cell-level faults such as short circuits, broken cables, and reverse polarity scenarios, and faults between cells and broken wire connections to the cell monitoring unit in the BMS in temperatures with resistances up to 4 MΩ. Providing the necessary channel-to-system isolation levels of 1kV for your tests, this unit protects your entire testing environment, avoiding unwanted interactions between different testing components, and allows you to test your controllers safely.
The 2U rack-mountable unit provides up to 36 independent and isolated channels, with up to 24 channels for the FIU and up to 12 for the TSE.
The unified TSE with FIU is an ideal extension to the Speedgoat Battery Cell Emulator (BCE). It can be easily integrated into a rack system, making it ideal for large-scale HIL testing with thousands of I/O signals.
Key Features
- Programmable resistor chain with a range up to 4 MΩ, adjustable in 1 Ω steps, and accuracy of 0.1 % ± 500 mΩ across the entire range of values
- Fault insertion at the cell level; emulation of various fault scenarios: short circuit, reverse polarity, broken wire at the cell level and in connection to the BMS
- Plug-and-play compatibility with the Battery Cell Emulator unit
- Modular unit with up to 24 battery cell fault insertion channels along with up to 12 temperature sensor channels in one single unit
- Channel-to-system isolation up to 1 kV
- Channel-to-channel isolation up to 100 V
- Easy to configure with the Speedgoat I/O Blockset
- Seamless integration with Simulink® and Simscape™